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"Multivariable control of a metrological Atomic Force Microscope."
Michael J. C. Ronde et al. (2009)
- Michael J. C. Ronde, Roel J. E. Merry, Marinus Jacobus Gerardus van de Molengraft, Richard K. Koops, Maarten Steinbuch:
Multivariable control of a metrological Atomic Force Microscope. ECC 2009: 2265-2270
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