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"Embedded Model Control: Application to Interferometric Metrology Lines."

Enrico S. Canuto, Fabio Musso (2006)

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DOI: 10.1109/ETFA.2006.355348

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - conf/etfa/CanutoM06b
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Enrico S. Canuto, Fabio Musso:
Embedded Model Control: Application to Interferometric Metrology Lines. ETFA 2006: 493-500

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