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"COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits."

Ondrej Novák, Jirí Zahrádka, Zdenek Plíva (2005)

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DOI: 10.1007/11408901_30

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
  - conf/edcc/NovakZP05
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  - https://dblp.org/rec/conf/edcc/NovakZP05
Ondrej Novák, Jirí Zahrádka, Zdenek Plíva:
COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. EDCC 2005: 403-414

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