Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID"Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs."
Joachim Sudbrock et al. (2005)
- Joachim Sudbrock, Jaan Raik
, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz:
Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. DSD 2005: 79-82
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2023-03-23 23:59 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
