"A Statistical Model for Estimating the Effect of Process Variations on ..."

J. V. R. Ravindra, M. B. Srinivas (2007)

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DOI: 10.1109/DSD.2007.4341488

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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J. V. R. Ravindra, M. B. Srinivas:
A Statistical Model for Estimating the Effect of Process Variations on Delay and Slew Metrics for VLSI Interconnects. DSD 2007: 325-330

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