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"A New Approach for Defect Detection in X-ray CT Images."

Heiko Eisele, Fred A. Hamprecht (2002)

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DOI: 10.1007/3-540-45783-6_42

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/dagm/EiseleH02
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  - https://dblp.org/rec/conf/dagm/EiseleH02
Heiko Eisele, Fred A. Hamprecht:
A New Approach for Defect Detection in X-ray CT Images. DAGM-Symposium 2002: 345-352

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