"Learning a Similarity Metric Discriminatively, with Application to Face ..."

Sumit Chopra, Raia Hadsell, Yann LeCun (2005)

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DOI: 10.1109/CVPR.2005.202

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sumit Chopra, Raia Hadsell, Yann LeCun:
Learning a Similarity Metric Discriminatively, with Application to Face Verification. CVPR (1) 2005: 539-546

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