"Test Generation Of Analog Switched-Current Circuits."

Cheng-Ping Wang, Chin-Long Wey (1996)

Details and statistics

DOI: 10.1109/ATS.1996.555171

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics