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"Reducibility of Sequential Test Generation to Combinational Test ..."

Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara (2003)

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DOI: 10.1109/ATS.2003.1250783

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/IwagakiOF03
Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara:
Reducibility of Sequential Test Generation to Combinational Test Generation for Several Delay Fault Models. Asian Test Symposium 2003: 58-63

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