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"Demonstrate high Roff/Ron ratio and forming-free RRAM for rFPGA ..."

Wenfeng Dong et al. (2017)

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DOI: 10.1109/ASICON.2017.8252610

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-17

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  dblp key:
  - conf/asicon/DongLXCZ17
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Wenfeng Dong, Dong Liu, Shun Xu, Bing Chen, Yi Zhao:
Demonstrate high Roff/Ron ratio and forming-free RRAM for rFPGA application based on switching layer engineering. ASICON 2017: 851-854

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