"A novel metric for quantitatively measuring memory effects in OOFDM system."

Muyu Huang et al. (2013)

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DOI: 10.1109/WOCC.2013.6676429

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-01

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Muyu Huang, Jun Li, Hao He, Meihua Bi, Shilin Xiao, Weisheng Hu:
A novel metric for quantitatively measuring memory effects in OOFDM system. WOCC 2013: 546-548

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