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"Attention Modules Improve Image-Level Anomaly Detection for Industrial ..."

André Luiz Buarque Vieira e Silva et al. (2024)

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DOI: 10.1109/WACV57701.2024.00806

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-17

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André Luiz Buarque Vieira e Silva, Francisco Simões, Danny Kowerko, Tobias Schlosser, Felipe Battisti, Veronica Teichrieb:
Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study. WACV 2024: 8231-8240

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