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"Attention Modules Improve Image-Level Anomaly Detection for Industrial ..."
André Luiz Buarque Vieira e Silva et al. (2024)
- André Luiz Buarque Vieira e Silva, Francisco Simões, Danny Kowerko, Tobias Schlosser, Felipe Battisti, Veronica Teichrieb:
Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study. WACV 2024: 8231-8240
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