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"Enhancing testability by structured partial scan."

Peter Wohl, John A. Waicukauski, Jonathon E. Colburn (2012)

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DOI: 10.1109/VTS.2012.6231095

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - https://dblp.org/rec/conf/vts/WohlWC12
Peter Wohl, John A. Waicukauski, Jonathon E. Colburn:
Enhancing testability by structured partial scan. VTS 2012: 152-157

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