"Power-aware test generation with guaranteed launch safety for at-speed ..."

Xiaoqing Wen et al. (2011)

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DOI: 10.1109/VTS.2011.5783778

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor:
Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS 2011: 166-171

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