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"On the decline of testing efficiency as fault coverage approaches 100%."

Li-C. Wang et al. (1995)

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DOI: 10.1109/VTEST.1995.512620

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/WangMKW95
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  persistent URL:
  - https://dblp.org/rec/conf/vts/WangMKW95
Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams:
On the decline of testing efficiency as fault coverage approaches 100%. VTS 1995: 74-83

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