"Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ..."

Josep Rius Vázquez, José Pineda de Gyvez (2004)

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DOI: 10.1109/VTEST.2004.1299225

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/VazquezG04
Josep Rius Vázquez, José Pineda de Gyvez:
Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs. VTS 2004: 53-58

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