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"An Evaluation of Pseudo Random Testing for Detecting Real Defects."

Chao-Wen Tseng et al. (2001)

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DOI: 10.1109/VTS.2001.923469

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-16

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  dblp key:
  - conf/vts/TsengMMD01
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  persistent URL:
  - https://dblp.org/rec/conf/vts/TsengMMD01
Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410

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