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"A Regression Based Technique for ATE-Aware Test Data Volume Estimation of ..."

Rajesh Tiwari et al. (2008)

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DOI: 10.1109/VTS.2008.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/TiwariSWRP08
Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi, Rubin A. Parekhji:
A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. VTS 2008: 53-58

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