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"On the Reliability of In-Memory Computing: Impact of Temperature on ..."

Simon Thomann et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441038

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-30

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  dblp key:
  - conf/vts/ThomannLZ0YHA21
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Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch:
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. VTS 2021: 1-6

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