"Innovation Practices Track: Testability and Dependability of AI Hardware ..."

Fei Su et al. (2023)

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DOI: 10.1109/VTS56346.2023.10140002

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-09

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Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch:
Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. VTS 2023: 1

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