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"Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks."
Victor M. van Santen et al. (2021)
- Victor M. van Santen
, Simon Thomann
, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch
:
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. VTS 2021: 1-7
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