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"Increasing testability by clock transformation (getting rid of those darn ..."

Krishna B. Rajan, David E. Long, Miron Abramovici (1996)

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DOI: 10.1109/VTEST.1996.510861

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/RajanLA96
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  persistent URL:
  - https://dblp.org/rec/conf/vts/RajanLA96
Krishna B. Rajan, David E. Long, Miron Abramovici:
Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230

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