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"Test Generation for Defect-Based Faults of Scan Flip-Flops."

Yu-Teng Nien et al. (2023)

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DOI: 10.1109/VTS56346.2023.10140039

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-09

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  dblp key:
  - conf/vts/NienLWWWC23
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  - https://dblp.org/rec/conf/vts/NienLWWWC23
Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao:
Test Generation for Defect-Based Faults of Scan Flip-Flops. VTS 2023: 1-7

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