"Efficient generation of parametric test conditions for AMS chips with an ..."

Felix Neubauer et al. (2018)

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DOI: 10.1109/VTS.2018.8368645

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/NeubauerBRR0018
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  - https://dblp.org/rec/conf/vts/NeubauerBRR0018
Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer:
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. VTS 2018: 1-6

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