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"Efficient generation of parametric test conditions for AMS chips with an ..."
Felix Neubauer et al. (2018)
- Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker
, Matthias Sauer:
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. VTS 2018: 1-6
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