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"Testable design for BiCMOS stuck-open fault detection."
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya (1993)
- Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Testable design for BiCMOS stuck-open fault detection. VTS 1993: 296-302
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