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"ELF-Murphy Data on Defects and Test Sets."
Edward J. McCluskey et al. (2004)
- Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22
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