"Path Selection for Delay Testing of Deep Sub-Micron Devices Using ..."

Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee (2000)

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DOI: 10.1109/VTEST.2000.843832

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jing-Jia Liou, Kwang-Ting Cheng, Deb Aditya Mukherjee:
Path Selection for Delay Testing of Deep Sub-Micron Devices Using Statistical Performance Sensitivity Analysis. VTS 2000: 97-104

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