"Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access."

Carter Hamilton et al. (1999)

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DOI: 10.1109/VTEST.1999.766697

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Carter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud:
Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access. VTS 1999: 413-419

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