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"Code disjoint self-parity combinational circuits for self-testing, ..."

Michael Gössel, Egor S. Sogomonyan (1994)

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DOI: 10.1109/VTEST.1994.292320

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/vts/GosselS94
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  persistent URL:
  - https://dblp.org/rec/conf/vts/GosselS94
Michael Gössel, Egor S. Sogomonyan:
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157

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