"Quantitative analysis of very-low-voltage testing."

Jonathan T.-Y. Chang, Edward J. McCluskey (1996)

Details and statistics

DOI: 10.1109/VTEST.1996.510876

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics