"Built-in Test Pattern Generation For High-Performance Cir cuits Using ..."

Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar (1999)

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DOI: 10.1109/VTEST.1999.766642

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar:
Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. VTS 1999: 22-27

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