"Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data."

Sounil Biswas, R. D. (Shawn) Blanton (2008)

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DOI: 10.1109/VTS.2008.35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sounil Biswas, R. D. (Shawn) Blanton:
Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. VTS 2008: 299-308

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