"Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in ..."

Partho Bhoumik, Christopher Bailey, Krishnendu Chakrabarty (2025)

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DOI: 10.1109/VTS65138.2025.11022917

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-23

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Partho Bhoumik, Christopher Bailey, Krishnendu Chakrabarty:
Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging^*. VTS 2025: 1-7

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