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ORCID"A novel built-in current sensor for IDDQ testing of deep ..."
Stephan P. Athan, David L. Landis, Sami A. Al-Arian (1996)
- Stephan P. Athan, David L. Landis, Sami A. Al-Arian:
A novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs. VTS 1996: 118-123
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