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"Special Session: Machine Learning for Semiconductor Test and Reliability."

Hussam Amrouch et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441052

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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  dblp key:
  - conf/vts/AmrouchCJKKKPST21
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  - https://dblp.org/rec/conf/vts/AmrouchCJKKKPST21
Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan:
Special Session: Machine Learning for Semiconductor Test and Reliability. VTS 2021: 1-11

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