Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An efficient test data reduction technique through dynamic pattern mixing ..."

Srinivasulu Alampally et al. (2011)

> Home

Details and statistics

DOI: 10.1109/VTS.2011.5783735

access: closed

type: Conference or Workshop Paper

metadata version: 2018-12-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vts/AlampallyVSPA11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/AlampallyVSPA11
Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal:
An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. VTS 2011: 285-290

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.