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ORCID"30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012"
- 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. IEEE Computer Society 2012, ISBN 978-1-4673-1074-1 [contents]
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