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"Integrated Models and Their Usage in Predicting the Signal Strength."

David J. Y. Lee, William C. Y. Lee (2014)

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DOI: 10.1109/VTCSPRING.2014.7022949

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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David J. Y. Lee, William C. Y. Lee:
Integrated Models and Their Usage in Predicting the Signal Strength. VTC Spring 2014: 1-5

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