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"A stochastic V2V LOS/NLOS model using neural networks for ..."

Christina Stadler et al. (2017)

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DOI: 10.1109/VNC.2017.8275597

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-26

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  - conf/vnc/StadlerFGDGE17
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Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German, David Eckhoff:
A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. VNC 2017: 195-202

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