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"First Study of the Charge Trapping Aggravation Induced by ..."
Zuopu Zhou et al. (2023)
- Zuopu Zhou, Leming Jiao, Zijie Zheng, Xiaolin Wang, Dong Zhang, Kai Ni, Xiao Gong:
First Study of the Charge Trapping Aggravation Induced by Anti-Ferroelectric Switching in the MFIS Stack. VLSI Technology and Circuits 2023: 1-2
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