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"HZO Scaling and Fatigue Recovery in FeFET with Low Voltage Operation: ..."

Zuocheng Cai et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185295

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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Zuocheng Cai, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi:
HZO Scaling and Fatigue Recovery in FeFET with Low Voltage Operation: Evidence of Transition from Interface Degradation to Ferroelectric Fatigue. VLSI Technology and Circuits 2023: 1-2

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