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"Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET ..."

Md Nur K. Alam et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830476

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-04

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  - conf/vlsit/AlamHTKPORDHH22
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Md Nur K. Alam, Yusuke Higashi, Brecht Truijen, Ben Kaczer, Mihaela Ioana Popovici, Bj O'Sullivan, Philippe Roussel, Robin Degraeve, Marc M. Heyns, Jan Van Houdt:
Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements. VLSI Technology and Circuits 2022: 340-342

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