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"Soft Error Rate Analysis for Combinational Logic Using An Accurate ..."

Feng Wang et al. (2007)

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DOI: 10.1109/VLSID.2007.145

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Feng Wang, Yuan Xie, R. Rajaraman, Balaji Vaidyanathan:
Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model. VLSI Design 2007: 165-170

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