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"Inductance Characterization of Small Interconnects Using Test-Signal Method."

Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal (2000)

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DOI: 10.1109/ICVD.2000.812636

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/ShahDS00
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal:
Inductance Characterization of Small Interconnects Using Test-Signal Method. VLSI Design 2000: 376-

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