"Dynamic test Sequence compaction for Sequential Circuits."

Anand Raghunathan, Srimat T. Chakradhar (1996)

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DOI: 10.1109/ICVD.1996.489479

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Anand Raghunathan, Srimat T. Chakradhar:
Dynamic test Sequence compaction for Sequential Circuits. VLSI Design 1996: 170-173

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