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"Post-Silicon Validation: Automatic Characterization of RF Device ..."
Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee (2017)
- Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee:
Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. VLSID 2017: 403-408
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