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"Post-Silicon Validation: Automatic Characterization of RF Device ..."

Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee (2017)

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DOI: 10.1109/VLSID.2017.86

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee:
Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. VLSID 2017: 403-408

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