"A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET."

Adil Meersha, B. Sathyajit, Mayank Shrivastava (2017)

Details and statistics

DOI: 10.1109/VLSID.2017.67

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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