"Fault Models and Device Yield of a Large Population of Room Temperature ..."

Daniel Mazor et al. (2007)

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DOI: 10.1109/VLSID.2007.183

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie:
Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. VLSI Design 2007: 657-664

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