"Efficient Space/Time Compression to Reduce Test Data Volume and Testing ..."

Lei Li et al. (2005)

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DOI: 10.1109/ICVD.2005.87

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan:
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. VLSI Design 2005: 53-58

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