"Metrics to Quantify Steady and Transient Gate Leakage in Nanoscale ..."

Elias Kougianos, Saraju P. Mohanty (2007)

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DOI: 10.1109/VLSID.2007.107

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Elias Kougianos, Saraju P. Mohanty:
Metrics to Quantify Steady and Transient Gate Leakage in Nanoscale Transistors: NMOS vs. PMOS Perspective. VLSI Design 2007: 195-200

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